Daqian Hei

Oct 12, 2024 | tandfonline.com | Xingyu Wang |Daqian Hei |Siyu Liao |Ge Zhou

AbstractHigh-entropy alloys (HEAs) have attracted significant attention in recent years owing to their exceptional material properties; however, trace impurities in these alloys can significantly affect their strength, toughness, and radiation resistance. This study employs total reflection X-ray fluorescence (TXRF) to determine the trace impurities in three common HEA powders prepared via suspension techniques.