Enam A. Chowdhury

Feb 22, 2023 | opg.optica.org | Ziyao Su |Carmen S. Menoni |Enam A. Chowdhury |Simin Zhang

AbstractMultilayer dielectric (MLD) gratings with high diffraction efficiency and a high laser-induced damage (LID) threshold for pulse compressors are key to scaling the peak and average power of chirped pulse amplification lasers. However, surface defects introduced by manufacturing, storage, and handling processes can reduce the LID resistance of MLD gratings and impact the laser output. The underlying mechanisms of such defect-initiated LID remain unclear, especially in the femtosecond regime.