Jason Neff

Oct 26, 2024 | scholarsarchive.byu.edu | Jason Neff |Richard R. Vanfleet |Brigham Young

Keywordstitanium dioxide, transmission electron microscope, GaN, Gallium NitrideCollegePhysical and Mathematical SciencesDepartmentPhysics and AstronomyAbstractThe original title submitted for my research was “Stacking Faults in GaN”. This study was aimed at employing the use of the Transmission Electron Microscope (TEM) to understand and image defects in the crystal lattice of Gallium Nitride (GaN) that lead to stacking faults.