Jon M. Quigley's profile photo

Jon M. Quigley

North Carolina

Author & contributor books & mag columns, speaker, award-winning, product development expert & teacher. engineer, MBA, MScPM degrees, IP generator, bass player.

Articles

  • 3 days ago | valuetransform.com | Jon M. Quigley

    Jon M QuigleyThe genesis of this post is  https://www.linkedin.com/feed/update/urn:li:activity:7343144597839056897/We often seek out best practices for outsourced testing as if there is a silver bullet. That is not so. Some key principles help. Outsourced testing is often criticized as a shortcut that leads to poor quality, delayed launches, and lost accountability. But with the right strategy, metrics, clear communication, and a robust review process, it can be a powerful asset, not a liability.

  • 1 week ago | valuetransform.com | Jon M. Quigley

    Why Purchasing Matters in Project ManagementPurchasing is a cornerstone of successful project management, directly impacting cost, quality, and schedule. Purchasing and supplier selection figure prominently in product development and project management, emphasizing that effective purchasing is not just about buying goods or services—it’s about strategic supplier selection, risk management, and aligning procurement with project objectives.[i] [ii].

  • 2 weeks ago | valuetransform.com | Jon M. Quigley

    By Jon M. QuigleyFrom Robert Fey’s post on LinkedIn.Response:   Delayed SOP Is Just the Tip—Systemic Blindness Runs DeepWhen a delayed SOP (Start of Production) surfaces, it’s tempting to blame test quality or last-minute execution. These are failure points for sure. However, it can also be uncontrolled scope changes, poor configuration, poor change management, and many other factors.

  • 2 weeks ago | valuetransform.com | Jon M. Quigley

    How Microsoft Project AI Integration is Transforming Resource Forecasting AI, Data Analytics, Digital Transformation, Jon M.

  • 1 month ago | valuetransform.com | Jon M. Quigley

    Compare ATEF Text Based on the Works of Jon M. Quigley ATEF, automotive testing, Benchmarking, CI/CD in automotive, Fault detection, Jon M.

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