Sevvandi Kandanaarachchi

Aug 30, 2023 | dx.doi.org | Sevvandi Kandanaarachchi |Wil Gardner |Benjamin W. Muir |Philippe A. Chouinard

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful surface analytical technique capable of elucidating the atomic and molecular composition of a wide range of organic and inorganic sample surfaces. In a typical ToF-SIMS experiment, a primary ion beam is rastered across the surface of a sample, causing the emission of secondary ions at each x and y position in the analysis area.