Tim Grieb

Feb 19, 2024 | onlinelibrary.wiley.com | Florian Krause |Tim Grieb |Thorsten Mehrtens |Christoph Mahr

1 INTRODUCTION For over a decade, there has been a strong effort to characterise electric (and magnetic) fields at the nanometre scale using scanning-transmission electron microscopy (STEM). The key to the measurement of these fields is the so-called momentum-resolved STEM,1 where the lateral momentum transfer to the probe electrons (by the interaction with the specimen) is measured.