Xiaojun Bai

Mar 20, 2024 | opg.optica.org | Junyong Zhang |Xiaojun Bai |Huiya Liu |Cheng Liu

Hard x-rays are widely used for plasma diagnosis, nondestructive inspection, and high-resolution x-ray imaging. A typical x-ray source is a tabletop micro-focus x-ray source. Here, a bifocal photon sieve (PS) with the smallest diameter of 59.6 nm was designed and fabricated by electron-beam lithography to focus hard x-rays on variable-resolution array images. An imaging experiment at 8.39 keV demonstrates that the designed and fabricated PS has two different focal lengths.