Yaoyao Chen

Nov 20, 2023 | onlinelibrary.wiley.com | Yaoyao Chen |Yu Zhang |Wei Wang |Xuan Song

1 Introduction Properties of atomically thin 2D materials are extremely sensitive to structural imperfections including defects, edges, wrinkles, and grain boundaries.[1, 2] Precise characterization of atomic structures and electronic states at these structures has long been a pursuit of the nanoelectronics community.

May 30, 2023 | onlinelibrary.wiley.com | Liujun Xiao |Guocheng Wang |Jinfeng Chang |Yaoyao Chen

Filename Description geb13705-sup-0001-Supinfo.docxWord 2007 document , 3.9 MB Fig. S1. Please note: The publisher is not responsible for the content or functionality of any supporting information supplied by the authors. Any queries (other than missing content) should be directed to the corresponding author for the article.