Yuanwei Sun

Feb 2, 2023 | dx.doi.org | Huan Ren |Yuanwei Sun |Peng Gao |Kevin Ryan

Compared to the conventional ZB-WZ stacking fault that aligns with the crystal growth axis, a novel heteroaxial ZB-WZ stacking fault axis that intercepts the growth axis by 70.3° is observed and analyzed in this report. The formation of the reported heteroaxial ZB-WZ stacking fault is attributed to the nanocrystals’ tendency to achieve the lowest possible systematic disorder by avoiding atomic array distortion at the intersection of two tetrahedral polytypic interphases.