Dongil Ho

Jul 27, 2023 | pubs.rsc.org | Hyunwoo Kang |Dongil Ho |Youngseok Kim |Jaeseung C. Kim

Effect of Channel Thickness on Radiation Hardness of Solution-Processed Oxide Thin Film Transistors Hyunwoo Kang,   Dongil Ho,   Youngseok Kim,   Jaeseung Kim,   Hyunjung Kim  and  Choongik Kim   Abstract The effects of channel thickness of thin film transistors (TFTs) based on solution-processed amorphous zinc-indium-tin-oxide (a-ZITO) semiconductor on radiation hardness against proton irradiation was investigated.