Minji Lee

1 month ago | onlinelibrary.wiley.com | Minsu Kim |Minji Lee |Inyoung Choi |Jihye Oh

Conflict of Interest The authors declare no conflict of interest. Supporting Information Filename Description smll202411632-sup-0001-SuppMat.docx5.8 MB Supporting Information References 1, , , , , J. Mater. Chem. A 2019, 7, 2942. 2, , , , Mater. Today 2015, 18, 252. 3, Conserv. Lett. 2011, 4, 202. 4, , , , , , , Electrochem. Energy Rev. 2020, 3, 1. 5, , Electrochem. Soc. Interface 2012, 21, 45. 6, , , , ACS Energy Lett. 2018, 3, 2480. 7, , , , Energy Environ. Sci.

Aug 6, 2024 | dx.doi.org | Minji Lee |Inyoung Choi |Ayoung Kim |Daye Kim

Jul 10, 2023 | semiwiki.com | Minji Lee

Are you Aware about Risks Related to Soft Errors? Categories: EDA, IROC Technologies Soft errors change stored data and cause temporal malfunctions in electronic systems. This mainly occurs when radiation particles collide with semiconductor devices. Soft errors are a concern in all environments, whether in the atmosphere, in space, or on the ground.

Jun 22, 2023 | onlinelibrary.wiley.com | Michael Daniels |Minji Lee |Wei Feng

Abstract In longitudinal studies, it is not uncommon to make multiple attempts to collect a measurement after baseline. Recording whether these attempts are successful provides useful information for the purposes of assessing missing data assumptions. This is because measurements from subjects who provide the data after numerous failed attempts may differ from those who provide the measurement after fewer attempts.