Niko Oinonen

Dec 14, 2023 | dx.doi.org | Lauri Kurki |Niko Oinonen |Adam Foster

Scanning probe microscopy (SPM) methods are powerful tools for studying nanoscale systems with atomic resolution. As the basis of SPM methods, scanning tunneling microscopy (STM) (1) and atomic force microscopy (AFM) (2) have been widely utilized in the characterization of various systems, such as biological samples, hybrid inorganic–organic interfaces, and individual steps of on-surface reactions.