Panos Liatsis

1 month ago | journals.plos.org | Zeeshan Khan |Waqar Ahmed |Abu Dhabi |Panos Liatsis

Loading metrics Open Access Peer-reviewedResearch Article Citation: Khan ZA, Ahmed W, Liatsis P (2025) AMD-FV: Adaptive margin loss and dual path network+ for deep face verification. PLoS One 20(5): e0324485. https://doi.org/10.1371/journal.pone.0324485Editor: Lei Chu, University of Southern California, UNITED STATES OF AMERICAReceived: July 14, 2024; Accepted: April 25, 2025; Published: May 28, 2025Copyright: © 2025 Khan et al.