Centrale Supélec

Oct 25, 2024 | onlinelibrary.wiley.com | Centrale Supélec |Patricia Rodrigues

Conflict of Interest The authors declare no conflict of interest. References 1 , , , , Prog. Mater. Sci. 2012, 57, 911. 2 , , , , , , Prog. Mater. Sci. 2016, 83, 630. 3 , , , , , Appl. Surf. Sci. 2020, 517, 146118. 4 , , Prog. Mater. Sci. 2005, 50, 511. 5 , , , Acta Mater. 2002, 50, 793. 6 , , , , in Powder Metallurgical Processing of NiTi Using Spark Plasma Sintering, Vol. 3, Elsevier Inc., Oxford 2017.

Oct 7, 2024 | pubs.aip.org | Centrale Supélec |Thales Research |Sebastian Schulz

We propose and demonstrate a modulation transfer protocol to increase the detection sensitivity of a Rydberg RF receiver to fields out of resonance from the transition between Rydberg levels. This protocol is based on a phase modulation of the control field used to create the Electromagnetically Induced Transparency signal. The nonlinear wave mixing of the multi-component coupling laser and the probe laser transfers the modulation to the probe laser, which is used for the RF-field detection.

Jun 4, 2024 | link.aps.org | Ran Xu |Centrale Supélec |Laboratoire SPMS

Ferroelectric-dielectric superlattices have attracted renewed interest for their ability to frustrate the polar order, leading to the emergence of exotic polar textures. The electrostatic depolarization, thought to be responsible for the complex polar textures in these superlattices, can be alleviated by replacing the dielectric layer with a metallic one. One would thus expect that a close to uniform polarization state be recovered in the ferroelectric layer.

Mar 21, 2024 | onlinelibrary.wiley.com | Centrale Supélec |Laboratoire SPMS

2.1. 1-RDM reconstruction using least-squares fitting For a spin-traced (spin-free) pure-state N-electron system, the 1-RDM can be derived by integrating out the N − 1 coordinates of the N-electron-density matrix, i.e. where ψ(r, r2, … rN) is the pure-state N-electron wavefunction.

Sep 27, 2023 | pubs.aip.org | Laboratoire SPMS |Centrale Supélec

Topics Phase transitions, Semiconductor device fabrication, Epitaxy, Polycrystalline material, Resistivity measurements, Raman spectroscopy, Magnetron sputtering, Thin films, X-ray diffraction The growing demand of the Internet of Things pushes the telecommunication industry to find solutions for increasing the data exchange rate and the sustainability of the electronic components.