
Hugh Ramsden
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Apr 11, 2023 |
dx.doi.org | Yan Wang |Hugh Ramsden |Yiru Zhu
Abstractvan der Waals heterostructures (vdW-HSs) integrate dissimilar materials to form complex devices. These rely on the manipulation of charges at multiple interfaces. However, at present, submicrometer variations in strain, doping, or electrical breakages may exist undetected within a device, adversely affecting macroscale performance. Here, we use conductive mode and cathodoluminescence scanning electron microscopy (CM-SEM and SEM-CL) to investigate these phenomena.
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