
Yiru Zhu
Articles
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Jan 19, 2025 |
nature.com | Soumya Sarkar |Peter Newton |Yiru Zhu |Maheera Abdul Ghani |Hu Young Jeong |Yan Wang
AbstractGraphene-based spintronic devices require efficient spin injection, and dielectric tunnel barriers are typically used to facilitate spin injection. However, the direct growth of ultrathin dielectrics on two-dimensional surfaces is challenging and unreliable. Here we report spin injection in graphene lateral spin valves using ferromagnetic van der Waals contacts of indium and cobalt (In–Co), and without the deposition of dielectric tunnel barriers.
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Oct 25, 2024 |
mdpi.com | Yong Liu |Yiru Zhu |Jianping Deng |Jian Zhan
All articles published by MDPI are made immediately available worldwide under an open access license. No special permission is required to reuse all or part of the article published by MDPI, including figures and tables. For articles published under an open access Creative Common CC BY license, any part of the article may be reused without permission provided that the original article is clearly cited. For more information, please refer to https://www.mdpi.com/openaccess.
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Oct 18, 2023 |
dx.doi.org | Soumya Sarkar |Jung-In Lee |Yiru Zhu |Maheera Abdul Ghani
Download Hi-Res ImageDownload to MS-PowerPointCite This:ACS Appl. Mater.
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Aug 16, 2023 |
mdpi.com | Yiru Zhu |Congsheng Zhang |Pinzhi Sun |Shangrui Fan
3. Results 3.1. Formulation Development for “Jifang E” Sustained-Release InjectionPoloxamer 407 was chosen as a sustained-release excipient because it is a substance with amphiphilic properties of polyethylene oxide (PEO) and polypropylene oxide (PPO), which can be gelled below physiological temperature at concentrations of 15% to 30% (w/v), and the gelling temperature gradually decreases as the concentration increases (Figure 1A).
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Apr 11, 2023 |
dx.doi.org | Yan Wang |Hugh Ramsden |Yiru Zhu
Abstractvan der Waals heterostructures (vdW-HSs) integrate dissimilar materials to form complex devices. These rely on the manipulation of charges at multiple interfaces. However, at present, submicrometer variations in strain, doping, or electrical breakages may exist undetected within a device, adversely affecting macroscale performance. Here, we use conductive mode and cathodoluminescence scanning electron microscopy (CM-SEM and SEM-CL) to investigate these phenomena.
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