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Yuanting Lyu

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  • Sep 19, 2024 | onlinelibrary.wiley.com | Zhichun Li |Ao Zhang |Jianjun Gao |Yuanting Lyu

    REFERENCES 1, , , et al. A critical review of design and fabrication challenges in InP HEMTs for future terahertz frequency applications. Mater Sci Semicond Process. 2021; 128:105753. 2. Thermal noise in field-effect transistors. Proc IRE. 1962; 50(8): 1808-1812. 3. Modeling of noise parameters of MESFETs and MODFETs and their frequency and temperature dependence. IEEE Trans Microw Theory Tech. 1989; 37(9): 1340-1350. 4.

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